Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

Autor: Cazottes, S., Zhang, Z.L., Daniel, R., Chawla, J.S., Gall, D., Dehm, G.
Zdroj: In Thin Solid Films 2010 519(5):1662-1667
Databáze: ScienceDirect