Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
Autor: | Cazottes, S., Zhang, Z.L., Daniel, R., Chawla, J.S., Gall, D., Dehm, G. |
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Zdroj: | In Thin Solid Films 2010 519(5):1662-1667 |
Databáze: | ScienceDirect |
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