Oxygen ion drifted bipolar resistive switching behaviors in TiO 2–Al electrode interfaces

Autor: Do, Young Ho, Kwak, June Sik, Bae, Yoon Cheol, Jung, Kyooho, Im, Hyunsik, Hong, Jin Pyo
Zdroj: In Thin Solid Films 2010 518(15):4408-4411
Databáze: ScienceDirect