Comparison of the top-down and bottom-up approach to fabricate nanowire-based silicon/germanium heterostructures

Autor: Wolfsteller, A., Geyer, N., Nguyen-Duc, T.-K., Das Kanungo, P., Zakharov, N.D., Reiche, M., Erfurth, W., Blumtritt, H., Kalem, S., Werner, P., Gösele, U.
Zdroj: In Thin Solid Films 2010 518(9):2555-2561
Databáze: ScienceDirect