Analyzing residual stress in bilayer chalcogenide Ge 2Se 3/SnTe films
| Autor: | Devasia, Archana, Bai, Feiming, Davis, Morgan, Campbell, Kristy A., Gupta, Surendra, Kurinec, Santosh |
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| Zdroj: | In Thin Solid Films 2009 517(24):6516-6519 |
| Databáze: | ScienceDirect |
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