Small angle X-ray scattering measurements of spatial dependent linewidth in dense nanoline gratings

Autor: Wang, Chengqing, Fu, Wei-En, Li, Bin, Huang, Huai, Soles, Christopher, Lin, Eric K., Wu, Wen-li, Ho, Paul S., Cresswell, Michael W.
Zdroj: In Thin Solid Films 2009 517(20):5844-5847
Databáze: ScienceDirect