Hysteresis in metal insulator semiconductor structures with high temperature annealed ZrO 2/SiO x layers
| Autor: | Gueorguiev, Valentin K., Aleksandrova, Petya V., Ivanov, Tzvetan E., Koprinarova, Jordanka B. |
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| Zdroj: | In Thin Solid Films 2009 517(5):1815-1820 |
| Databáze: | ScienceDirect |
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