TEM study of RTD structure fabricated with epi-Si/γ-Al 2O 3 heterostructure

Autor: Shahjahan, M., Khatun, Mst. Halima, Sawada, K., Ishida, M.
Zdroj: In Thin Solid Films 2010 518(8):2295-2298
Databáze: ScienceDirect