Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space
| Autor: | Holý, V., Mundboth, K., Mokuta, C., Metzger, T.H., Stangl, J., Bauer, G., Boeck, T., Schmidbauer, M. |
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| Zdroj: | In Thin Solid Films 2008 516(22):8022-8028 |
| Databáze: | ScienceDirect |
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