Silicon nitride thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition for micromechanical system applications

Autor: Biasotto, C., Diniz, J.A., Daltrini, A.M., Moshkalev, S.A., Monteiro, M.J.R.
Zdroj: In Thin Solid Films 2008 516(21):7777-7782
Databáze: ScienceDirect