Study of plasma charging-induced white pixel defect increase in CMOS active pixel sensor
| Autor: | Tokashiki, Ken, Bai, KeunHee, Baek, KyeHyun, Kim, Yongjin, Min, Gyungjin, Kang, Changjin, Cho, Hanku, Moon, Jootae |
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| Zdroj: | In Thin Solid Films 2007 515(12):4864-4868 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect