Impact of seed layer on material quality of epitaxial germanium on silicon deposited by low pressure chemical vapor deposition

Autor: Olubuyide, Oluwamuyiwa O., Danielson, David T., Kimerling, Lionel C., Hoyt, Judy L.
Zdroj: In Thin Solid Films 2006 508(1):14-19
Databáze: ScienceDirect