Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBT
| Autor: | Piontek, A., Choi, L.J., Van Huylenbroeck, S., Vanhoucke, T., Hijzen, E., Decoutere, S. |
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| Zdroj: | In Thin Solid Films 2006 508(1):318-322 |
| Databáze: | ScienceDirect |
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