Structural study of amorphous In 2O 3 film by grazing incidence X-ray scattering (GIXS) with synchrotron radiation

Autor: Utsuno, Futoshi, Inoue, Hiroyuki, Yasui, Itaru, Shimane, Yukio, Tomai, Shigekazu, Matsuzaki, Shigeo, Inoue, Kazuyoshi, Hirosawa, Ichiro, Sato, Masugu, Honma, Tetsuo
Zdroj: In Thin Solid Films 2006 496(1):95-98
Databáze: ScienceDirect