Substrate effects correction in Auger electron spectrometry and electron probe microanalysis of thin films
| Autor: | Benhayoune, H., Dumelié, N., Balossier, G. |
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| Zdroj: | In Thin Solid Films 22 December 2005 493(1-2):113-123 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect