Engineering structure and properties of hafnium oxide films by atomic layer deposition temperature

Autor: Kukli, Kaupo *, Aarik, Jaan, Uustare, Teet, Lu, Jun, Ritala, Mikko, Aidla, Aleks, Pung, Lembit, Hårsta, Anders, Leskelä, Markku, Kikas, Arvo, Sammelselg, Väino
Zdroj: In Thin Solid Films 2005 479(1):1-11
Databáze: ScienceDirect