Optical properties of SiO 2/nanocrystalline Si multilayers studied using spectroscopic ellipsometry
| Autor: | Lee, Kang-Ju, Kang, Tae-Dong, Lee, Hosun *, Hong, Seung Hui, Choi, Suk-Ho, Seong, Tae-Yeon, Kim, Kyung Joong, Moon, Dae Won |
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| Zdroj: | In Thin Solid Films 2005 476(1):196-200 |
| Databáze: | ScienceDirect |
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