Profiling of deep traps in silicon oxide–nitride–oxide structures
| Autor: | Naich, M. *, Rosenman, G., Roizin, Ya. |
|---|---|
| Zdroj: | In Thin Solid Films 2005 471(1):166-169 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Naich, M. *, Rosenman, G., Roizin, Ya. |
|---|---|
| Zdroj: | In Thin Solid Films 2005 471(1):166-169 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect