Generalized ellipsometry for the characterization of anisotropic materials: influence of the sample adjustment on the extracted optical indices
| Autor: | Boher, P., Piel, J.P. *, Sacépé, B. |
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| Zdroj: | In Thin Solid Films 2004 455:581-585 |
| Databáze: | ScienceDirect |
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