Study of structure and optical properties of silver oxide films by ellipsometry, XRD and XPS methods
| Autor: | Gao, Xiao-Yong, Wang, Song-You, Li, Jing, Zheng, Yu-Xiang, Zhang, Rong-Jun, Zhou, Peng, Yang, Yue-Mei, Chen, Liang-Yao * |
|---|---|
| Zdroj: | In Thin Solid Films 2004 455:438-442 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect