Analytical electron microscopy and Auger electron spectroscopy study of low-temperature diffusion in multilayer chromium–copper–nickel–gold thin films
Autor: | Danylenko, M.I, Watanabe, M, Li, C, Krajnikov, A.V *, Williams, D.B, Vasiliev, M.A |
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Zdroj: | In Thin Solid Films 2003 444(1):75-84 |
Databáze: | ScienceDirect |
Externí odkaz: |
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