Roughness evolution of ZrO 2 thin films grown by reactive ion beam sputtering

Autor: Qi, H.J. *, Huang, L.H., Tang, Z.S., Cheng, C.F., Shao, J.D., Fan, Z.X.
Zdroj: In Thin Solid Films 2003 444(1):146-152
Databáze: ScienceDirect