Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devices

Autor: Patil, Samadhan B., Vairagar, Anand V., Kumbhar, Alka A., Sahu, Laxmi K., Ramgopal Rao, V., Venkatramani, N., Dusane, R.O. *, Schroeder, B.
Zdroj: In Thin Solid Films 2003 430(1):63-66
Databáze: ScienceDirect