Advanced excimer-laser crystallization process for single-crystalline thin film transistors

Autor: Ishihara, Ryoichi *, van der Wilt, Paul Ch., van Dijk, Barry D., Burtsev, Artyom, Metselaar, J.W., Beenakker, C.I.M.
Zdroj: In Thin Solid Films 2003 427(1):77-85
Databáze: ScienceDirect