Thickness dependence of photoemission and X-ray fluorescence spectra in epitaxial NiO layers on Ag(100)
| Autor: | Krasnikov, S.A. *, Preobrajenski, A.B., Chassé, T., Szargan, R. |
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| Zdroj: | In Thin Solid Films 2003 428(1):201-205 |
| Databáze: | ScienceDirect |
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