Quantitative characterization of the composition, thickness and orientation of thin films in the analytical electron microscope
| Autor: | Williams, D.B. *, Watanabe, M., Papworth, A.J., Li, J.C. |
|---|---|
| Zdroj: | In Thin Solid Films 2003 424(1):50-55 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect