In-situ thin film diagnostics using waveguide mode spectroscopy
| Autor: | Jacobsen, V., Menges, B., Förch, R. *, Mittler, S., Knoll, W. |
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| Zdroj: | In Thin Solid Films 2002 409(2):185-193 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Jacobsen, V., Menges, B., Förch, R. *, Mittler, S., Knoll, W. |
|---|---|
| Zdroj: | In Thin Solid Films 2002 409(2):185-193 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect