Effects of nitrogen flow rates on the growth morphology of TiAlN films prepared by an rf-reactive sputtering technique

Autor: Chakrabarti, K., Jeong, J.J., Hwang, S.K., Yoo, Y.C., Lee, C.M. *
Zdroj: In Thin Solid Films 2002 406(1):159-163
Databáze: ScienceDirect