Phase composition and microstructure of polycrystalline and epitaxial TaN x layers grown on oxidized Si(001) and MgO(001) by reactive magnetron sputter deposition

Autor: Shin, C.-S., Kim, Y.-W., Gall, D., Greene, J.E., Petrov, I. *
Zdroj: In Thin Solid Films 2002 402(1):172-182
Databáze: ScienceDirect