Structural and optical characterization of RF reactively sputtered CuInS 2 thin films

Autor: He, Y.B *, Polity, A, Alves, H.R, Österreicher, I, Kriegseis, W, Pfisterer, D, Meyer, B.K, Hardt, M
Zdroj: In Thin Solid Films 2002 403:62-65
Databáze: ScienceDirect