Structural and optical characterization of RF reactively sputtered CuInS 2 thin films
Autor: | He, Y.B *, Polity, A, Alves, H.R, Österreicher, I, Kriegseis, W, Pfisterer, D, Meyer, B.K, Hardt, M |
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Zdroj: | In Thin Solid Films 2002 403:62-65 |
Databáze: | ScienceDirect |
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