Optical emission spectroscopy study toward high rate growth of microcrystalline silicon

Autor: Fukuda, Yusuke, Sakuma, Yoshikazu, Fukai, Chisato, Fujimura, Yukihiro, Azuma, Kazufumi, Shirai, Hajime *
Zdroj: In Thin Solid Films 2001 386(2):256-260
Databáze: ScienceDirect