Hole transport due to shallow acceptors along boron doped SiGe quantum wells

Autor: Altukhov, I.V, Kagan, M.S *, Sinis, V.P, Thomas, S.G, Wang, K.L, Blom, A, Odnoblyudov, M.O
Zdroj: In Thin Solid Films 2000 380(1):218-220
Databáze: ScienceDirect