Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements
| Autor: | Laaziz, Y. *, Bennouna, A., Chahboun, N., Outzourhit, A., Ameziane, E.L. |
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| Zdroj: | In Thin Solid Films 2000 372(1):149-155 |
| Databáze: | ScienceDirect |
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