Strain-driven modification of the Ge/Si growth mode in stacked layers: a way to produce Ge islands having equal size in all layers

Autor: Le Thanh, Vinh *, Yam, V, Boucaud, P, Zheng, Y, Bouchier, D
Zdroj: In Thin Solid Films 3 July 2000 369(1-2):43-48
Databáze: ScienceDirect