Investigations on the growth mechanism of wide-gap II–VI semiconductors by means of reflection high energy electron diffraction
| Autor: | Griesche, J. * |
|---|---|
| Zdroj: | In Thin Solid Films 15 May 2000 367(1-2):159-164 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Griesche, J. * |
|---|---|
| Zdroj: | In Thin Solid Films 15 May 2000 367(1-2):159-164 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect