Determination of molecular orientation of α-sexithiophene on passivated Si(001) by means of optical reflectance spectroscopic methods
| Autor: | Toyoshima, H., Inoue, K., Hiraga, K., Ohno, S., Tanaka, M. |
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| Zdroj: | In Surface Science October 2013 616:36-43 |
| Databáze: | ScienceDirect |
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