Stacking faults in ultra-thin films of silver on Al(111) investigated by medium energy ion scattering

Autor: Howe, C.J., Cropper, M.D., Wardle, R.M., Bailey, P., Noakes, T.C.Q.
Zdroj: In Surface Science 2010 604(19):1658-1665
Databáze: ScienceDirect