Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (1 1 1)-oriented PLZT 10/40/60 thin films
| Autor: | Ferri, A., Saitzek, S., Da Costa, A., Desfeux, R., Leclerc, G., Bouregba, R., Poullain, G. |
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| Zdroj: | In Surface Science 2008 602(11):1987-1992 |
| Databáze: | ScienceDirect |
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