Advanced ion energy loss models: Applications to subnanometric resolution elemental depth profiling
| Autor: | Pezzi, R.P., Grande, P.L., Copel, M., Schiwietz, G., Krug, C., Baumvol, I.J.R. |
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| Zdroj: | In Surface Science 2007 601(23):5559-5570 |
| Databáze: | ScienceDirect |
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