Combined AFM and Brewster-angle analysis of gradually etched ultrathin SiO 2 – Comparison with SRPES results
| Autor: | Lublow, M., Lewerenz, H.J. |
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| Zdroj: | In Surface Science 2007 601(7):1693-1700 |
| Databáze: | ScienceDirect |
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| Autor: | Lublow, M., Lewerenz, H.J. |
|---|---|
| Zdroj: | In Surface Science 2007 601(7):1693-1700 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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