Structural characterisation of ultra-thin VO x films on TiO 2(1 1 0)
| Autor: | Kröger, E.A., Allegretti, F., Knight, M.J., Polcik, M., Sayago, D.I., Woodruff, D.P., Dhanak, V.R. |
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| Zdroj: | In Surface Science 2006 600(21):4813-4824 |
| Databáze: | ScienceDirect |
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