Halogen chemisorption, the pairwise diffusion of I, and trapping by defects on Si(1 0 0)

Autor: Xu, G.J., Signor, A.W., Agrawal, Abhishek, Nakayama, Koji S., Trenhaile, B.R., Weaver, J.H.
Zdroj: In Surface Science 2005 577(1):77-85
Databáze: ScienceDirect