The combined study of the organosilicon films by RBS, ERDA and AFM analytical methods obtained from PECVD and PACVD

Autor: Mackova, A., Perina, V., Stryhal, Z., Pavlik, J., Svec, M., Quédé, A., Supiot, P., Borvon, G., Granier, A., Raynaud, P.
Zdroj: In Surface Science 2004 566 Part 2:1143-1146
Databáze: ScienceDirect