AFM and SNOM characterization of carboxylic acid terminated silicon and silicon nitride surfaces
| Autor: | Cricenti, A., Longo, G., Luce, M., Generosi, R., Perfetti, P., Vobornik, D., Margaritondo, G., Thielen, P., Sanghera, J.S., Aggarwal, I.D., Miller, J.K., Tolk, N.H., Piston, D.W., Cattaruzza, F., Flamini, A., Prosperi, T., Mezzi, A. |
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| Zdroj: | In Surface Science 2003 544(1):51-57 |
| Databáze: | ScienceDirect |
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