Isothermal adsorption and desorption studies of In/Si( [formula omitted]) by reflection high energy electron diffraction and fluorescent X-ray spectroscopy

Autor: Minami, N., Machida, Y., Kajikawa, T., Sato, T., Ota, K., Ino, S.
Zdroj: In Surface Science 2003 524(1):199-205
Databáze: ScienceDirect