Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells
| Autor: | Sommerhalter, Ch., Sadewasser, S. *, Glatzel, Th., Matthes, Th.W., Jäger-Waldau, A., Lux-Steiner, M.Ch. |
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| Zdroj: | In Surface Science 2001 482 Part 2:1362-1367 |
| Databáze: | ScienceDirect |
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