Current induced bunches of steps on the Si(111) surface – a key to measuring the temperature dependence of the step interaction coefficient
Autor: | Stoyanov, S. *, Métois, J.J., Tonchev, V. |
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Zdroj: | In Surface Science 2000 465(3):227-242 |
Databáze: | ScienceDirect |
Externí odkaz: |