Effect of extreme surface roughness on the electrical characteristics of ultra-thin gate oxides
| Autor: | Houssa, M, Nigam, T, Mertens, P.W, Heyns, M.M |
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| Zdroj: | In Solid State Electronics 1999 43(1):159-167 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Houssa, M, Nigam, T, Mertens, P.W, Heyns, M.M |
|---|---|
| Zdroj: | In Solid State Electronics 1999 43(1):159-167 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect