Defects in polysilicon channel: Insight from first principles and multi-scale modelling

Autor:	Maji, R., Rollo, T., Gangopadhyay, S., Luppi, E., Degoli, E., Nardi, F., Larcher, L., Pešić, M.
Zdroj:	In Solid State Electronics January 2025 223
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect