C-V characterization of the trap-rich layer in a novel Double-BOX structure
| Autor: | Huang, Yang, Liu, Fanyu, Cristoloveanu, Sorin, Ma, Shiqi, Nabet, Massinissa, Yan, Yiyi, Li, Bo, Li, Binhong, Nguyen, Bich-Yen, Han, Zhengsheng, Raskin, Jean-Pierre |
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| Zdroj: | In Solid State Electronics August 2024 218 |
| Databáze: | ScienceDirect |
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