Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs
| Autor: | Pathak, Shruti, Gupta, Sumreti, Rathi, Aarti, Srinivasan, P., Dixit, Abhisek |
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| Zdroj: | In Solid State Electronics July 2024 217 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Pathak, Shruti, Gupta, Sumreti, Rathi, Aarti, Srinivasan, P., Dixit, Abhisek |
|---|---|
| Zdroj: | In Solid State Electronics July 2024 217 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect